Contact Angle
ApplicationsMeasurement of Silicon wafer
- Comparative Measurement of contact angle / surface energy to reveal surface contaminations
- Measurement of Silicon wafer
- Measurement of photodiode
Technical Specifications
Krüss - EasyDrop FM40Mk2
- Measuring range: 1-180°
- Accuracy: +- 0.1°
- Max. sample dimensions: 300 mm × ∞ × 50mm (W × D × H)
- Computer controlled dosing
- Regulable illumination
- Objective: 6x zoom
Contact
Chemical and Physical Analytics
E-Mail: Analytic.SWM@osram.com
Chemical and Physical AnalyticsMittelstetter Weg 2, 86830 Schwabmünchen